Metrological Support for Wireless Sensor Systems

• Main Author: V.T. Kondratov
• Format: Article
• Language: English
• Published: V.M. Glushkov Institute of Cybernetics 2020-03-01
• Series: Кібернетика та комп'ютерні технології
• Subjects: optical smart sensors; self-calibration; wireless sensor systems; methods of redundant measurements; problems of metrological reliability
• Online Access: http://cctech.org.ua/13-vertikalnoe-menyu-en/113-abstract-20-1-9-arte

Abstract. The paper work identifies twelve problems of metrological reliability of wireless sensor systems that require their solution. The most urgent is the problem of determining the main parameters of the metrological reliability of wireless sensor systems. It is closely related to solving the problem of self-calibration of optical smart sensors that are part of the smart nodes of the system. The task of self-calibration of smart sensors is solved when three basic conditions are met: 1) when creating and using structurally redundant optical sensors designed to implement methods of redundant measurements; 2) when developing LEDs or other highly stable sources of optical radiation, including those with controlled parameters, for any given spectral range of wavelengths; 3) when creating in micro-performance filters on a priori given range of the spectrum of optical sines. The article describes two methods of metrological support for BSS smart sensors, based on the introduction of information redundancy by conducting three clock cycles of measuring physical quantity with a smart sensor, followed by processing the data using an a priori derived algorithm. The disadvantages and advantages of the methods are shown. It is stated that the use of the theory of excess measurements is the only correct way to solve the problem of self-calibration of sensors and measuring instruments. Given the harsh operating conditions of optical smart sensors, it is preferable to manufacture them using high technology. Today, in Ukraine, no one is engaged in a practical solution to the problems of metrological reliability of wireless sensor systems and the solution of the problems of self-calibration of smart sensors.