Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators

A systematic approach using Taguchi method is proposed for optimization of complementary metal oxide semiconductor microelectromechanical system surface acoustic wave (SAW) resonators. The aim of the present method is to enhance the performance of SAW devices in terms of electromechanical coupling c...

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Main Authors: Aliza Aini Md Ralib, Anis Nurashikin Nordin
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
ZnO
Online Access:https://ieeexplore.ieee.org/document/8651565/
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spelling doaj-9356db53767440c7ba05fe2b655e91bd2021-03-29T22:43:05ZengIEEEIEEE Access2169-35362019-01-017279932800010.1109/ACCESS.2019.29005908651565Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW ResonatorsAliza Aini Md Ralib0Anis Nurashikin Nordin1https://orcid.org/0000-0002-8301-4365Department of Electrical and Computer Engineering, Kulliyyah of Engineering, International Islamic University Malaysia, Kuala Lumpur, MalaysiaDepartment of Electrical and Computer Engineering, Kulliyyah of Engineering, International Islamic University Malaysia, Kuala Lumpur, MalaysiaA systematic approach using Taguchi method is proposed for optimization of complementary metal oxide semiconductor microelectromechanical system surface acoustic wave (SAW) resonators. The aim of the present method is to enhance the performance of SAW devices in terms of electromechanical coupling coefficient while reducing the design and development cost. Controllable factors such as a number of transducers, N<sub>t</sub>, the distance between input and output transducers, L<sub>c</sub>, and the thickness of the piezoelectric materials, T<sub>c</sub> have been optimized. L<sub>27</sub>(3<sup>13</sup>) orthogonal array was chosen to conduct 27 simulations with three level parameters. Time and cost efficient 2D finite element simulations were done using COMSOL Multiphysics&#x2122; for two-step analysis Eigen frequency and frequency domain analysis. The orthogonal array, signal to noise ratio, and analysis of variance (ANOVA) were calculated to determine the best settings of the design parameters. The maximum electromechanical coupling coefficient is achieved at the optimal condition of N = 6; L<sub>c</sub> = 1.6 &#x03BC;m; T<sub>c</sub> = 2.5 &#x03BC;m with increased performance by 4.68% for &#x03BA;<sup>2</sup> and 9.62% for G<sub>12</sub>(f ) compared to the initial conditions. The interaction between pairs of factors has also been investigated. The Taguchi method reveals that both N<sub>t</sub> and L<sub>c</sub>, and the interaction of N<sub>t</sub> &#x00D7; L<sub>c</sub> plays crucial roles in optimizing the electroacoustic conversion of the SAW devices. Hence, the experiment shows that the performance of the SAW device has been successfully optimized.https://ieeexplore.ieee.org/document/8651565/Electromechanical coupling coefficientpiezoelectric thin filmsurface acoustic wave resonatorTaguchi signal to noise ratioZnO
collection DOAJ
language English
format Article
sources DOAJ
author Aliza Aini Md Ralib
Anis Nurashikin Nordin
spellingShingle Aliza Aini Md Ralib
Anis Nurashikin Nordin
Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
IEEE Access
Electromechanical coupling coefficient
piezoelectric thin film
surface acoustic wave resonator
Taguchi signal to noise ratio
ZnO
author_facet Aliza Aini Md Ralib
Anis Nurashikin Nordin
author_sort Aliza Aini Md Ralib
title Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
title_short Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
title_full Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
title_fullStr Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
title_full_unstemmed Application of Taguchi Signal to Noise Ratio Design Method to ZnO Thin Film CMOS SAW Resonators
title_sort application of taguchi signal to noise ratio design method to zno thin film cmos saw resonators
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2019-01-01
description A systematic approach using Taguchi method is proposed for optimization of complementary metal oxide semiconductor microelectromechanical system surface acoustic wave (SAW) resonators. The aim of the present method is to enhance the performance of SAW devices in terms of electromechanical coupling coefficient while reducing the design and development cost. Controllable factors such as a number of transducers, N<sub>t</sub>, the distance between input and output transducers, L<sub>c</sub>, and the thickness of the piezoelectric materials, T<sub>c</sub> have been optimized. L<sub>27</sub>(3<sup>13</sup>) orthogonal array was chosen to conduct 27 simulations with three level parameters. Time and cost efficient 2D finite element simulations were done using COMSOL Multiphysics&#x2122; for two-step analysis Eigen frequency and frequency domain analysis. The orthogonal array, signal to noise ratio, and analysis of variance (ANOVA) were calculated to determine the best settings of the design parameters. The maximum electromechanical coupling coefficient is achieved at the optimal condition of N = 6; L<sub>c</sub> = 1.6 &#x03BC;m; T<sub>c</sub> = 2.5 &#x03BC;m with increased performance by 4.68% for &#x03BA;<sup>2</sup> and 9.62% for G<sub>12</sub>(f ) compared to the initial conditions. The interaction between pairs of factors has also been investigated. The Taguchi method reveals that both N<sub>t</sub> and L<sub>c</sub>, and the interaction of N<sub>t</sub> &#x00D7; L<sub>c</sub> plays crucial roles in optimizing the electroacoustic conversion of the SAW devices. Hence, the experiment shows that the performance of the SAW device has been successfully optimized.
topic Electromechanical coupling coefficient
piezoelectric thin film
surface acoustic wave resonator
Taguchi signal to noise ratio
ZnO
url https://ieeexplore.ieee.org/document/8651565/
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