High Ion/Ioff current ratio graphene field effect transistor: the role of line defect
The present paper casts light upon the performance of an armchair graphene nanoribbon (AGNR) field effect transistor in the presence of one-dimensional topological defects. The defects containing 5–8–5 sp2-hybridized carbon rings were placed in a perfect graphene sheet. The atomic scale behavior of...
Main Authors: | Mohammad Hadi Tajarrod, Hassan Rasooli Saghai |
---|---|
Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2015-10-01
|
Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.6.210 |
Similar Items
-
Single-parameter quantum valley pumping in graphene with topological line defect
by: Chongdan Ren, et al.
Published: (2020-03-01) -
Employing Microwave Graphene Field Effect Transistors for Infrared Radiation Detection
by: Antonio Benfante, et al.
Published: (2018-01-01) -
Simulation of 50-nm Gate Graphene Nanoribbon Transistors
by: Cedric Nanmeni Bondja, et al.
Published: (2016-01-01) -
Graphene Hot-electron Transistors
by: Vaziri, Sam
Published: (2016) -
Raman Spectroscopy Of Graphene And Graphene Analogue MoS2 Transistors
by: Chakraborty, Biswanath
Published: (2016)