Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape...

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Main Authors:	Stanislav S. Borysov, Daniel Forchheimer, David B. Haviland
Format:	Article
Language:	English
Published:	Beilstein-Institut 2014-10-01
Series:	Beilstein Journal of Nanotechnology
Subjects:	atomic force microscopy calibration multimodal AFM multifrequency AFM
Online Access:	https://doi.org/10.3762/bjnano.5.200

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spelling	doaj-90ae8f5b1e1f41dbb58076c4b98b7eb62020-11-24T22:01:55ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862014-10-01511899190410.3762/bjnano.5.2002190-4286-5-200Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactionsStanislav S. Borysov0Daniel Forchheimer1David B. Haviland2Nanostructure Physics, KTH Royal Institute of Technology, Roslagstullsbacken 21, SE-106 91 Stockholm, SwedenNanostructure Physics, KTH Royal Institute of Technology, Roslagstullsbacken 21, SE-106 91 Stockholm, SwedenNanostructure Physics, KTH Royal Institute of Technology, Roslagstullsbacken 21, SE-106 91 Stockholm, SwedenWe present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.https://doi.org/10.3762/bjnano.5.200atomic force microscopycalibrationmultimodal AFMmultifrequency AFM
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Stanislav S. Borysov Daniel Forchheimer David B. Haviland
spellingShingle	Stanislav S. Borysov Daniel Forchheimer David B. Haviland Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions Beilstein Journal of Nanotechnology atomic force microscopy calibration multimodal AFM multifrequency AFM
author_facet	Stanislav S. Borysov Daniel Forchheimer David B. Haviland
author_sort	Stanislav S. Borysov
title	Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
title_short	Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
title_full	Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
title_fullStr	Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
title_full_unstemmed	Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
title_sort	dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
publisher	Beilstein-Institut
series	Beilstein Journal of Nanotechnology
issn	2190-4286
publishDate	2014-10-01
description	We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.
topic	atomic force microscopy calibration multimodal AFM multifrequency AFM
url	https://doi.org/10.3762/bjnano.5.200
work_keys_str_mv	AT stanislavsborysov dynamiccalibrationofhighereigenmodeparametersofacantileverinatomicforcemicroscopybyusingtipsurfaceinteractions AT danielforchheimer dynamiccalibrationofhighereigenmodeparametersofacantileverinatomicforcemicroscopybyusingtipsurfaceinteractions AT davidbhaviland dynamiccalibrationofhighereigenmodeparametersofacantileverinatomicforcemicroscopybyusingtipsurfaceinteractions
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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

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