The Symmetric-Partitioning and Incremental-Relearning Classification and Back-Propagation-Network Tree Approach for Cycle Time Estimation in Wafer Fabrication

• Main Author: Toly Chen
• Format: Article
• Language: English
• Published: MDPI AG 2014-05-01
• Series: Symmetry
• Subjects: cycle time; estimation; classification and regression tree; symmetric partitioning; back propagation network; wafer fabrication
• Online Access: http://www.mdpi.com/2073-8994/6/2/409

An innovative classification and back-propagation-network tree (CABPN tree) approach is proposed in this study to estimate the cycle time of a job in a wafer fabrication factory, which is one of the most important tasks in controlling the wafer fabrication factory. The CABPN tree approach is an extension from the traditional classification and regression tree (CART) approach. In CART, the cycle times of jobs of the same branch are estimated with the same value, which is far from accurate. To tackle this problem, the CABPN tree approach replaces the constant estimate with variant estimates. To this end, the cycle times of jobs of the same branch are estimated with a BPN, and may be different. In this way, the estimation accuracy can be improved. In addition, to determine the optimal location of the splitting point on a node, the symmetric partition with incremental re-learning (SP-IR) algorithm is proposed and illustrated with an example. The applicability of the CABPN tree approach is shown with a real case. The experimental results supported its effectiveness over several existing methods.