Passivation layer effect on the positive bias temperature instability of molybdenum disulfide thin film transistors

As two-dimensional (2D) materials have a large surface to volume ratio, the stability of thin film transistors (TFTs) is likely to be lowered with air exposure. Therefore, we study the positive bias temperature instability (PBTI) of chemical vapor deposition (CVD) grown molybdenum disulfide (MoS2) T...

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Bibliographic Details
Main Authors: Woonggi Hong, Dong Sik Oh, Sung-Yool Choi
Format: Article
Language:English
Published: Taylor & Francis Group 2021-01-01
Series:Journal of Information Display
Subjects:
Online Access:http://dx.doi.org/10.1080/15980316.2020.1776407