In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals

In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals

Pb(Zr0.52Ti0.48)O3/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measu...

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Main Authors: Haifa Zhai, Yurong Jiang, Hongjing Li, Panpan Zhang, Yixiao He, Dandan Shi, Xiang Zhang, Jien Yang
Format: Article
Language:English
Published: Elsevier 2017-06-01
Series:Heliyon
Subjects:
Condensed matter physics
Nanotechnology
Materials science
Online Access:http://www.sciencedirect.com/science/article/pii/S2405844017303250
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spelling doaj-8f2190277e3043dbac3fc2eb78c0e0e22020-11-25T02:14:04ZengElsevierHeliyon2405-84402017-06-0136e00313In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystalsHaifa Zhai0Yurong Jiang1Hongjing Li2Panpan Zhang3Yixiao He4Dandan Shi5Xiang Zhang6Jien Yang7Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China; National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, People’s Republic of China; Corresponding author.Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaHenan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of ChinaPb(Zr0.52Ti0.48)O3/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measurements for the first time. It’s found that 10% PZT/PC composite film has the largest orientation change and negligible dielectric relaxation after poling (the φ value of 13.8% is almost constant with time even for 168 h). Based on the XRD results, we consider that the preferential orientation of PZT nanocrystals to align in PC matrix after poling is [001] direction.http://www.sciencedirect.com/science/article/pii/S2405844017303250Condensed matter physicsNanotechnologyMaterials science
collection DOAJ
language English
format Article
sources DOAJ
author Haifa Zhai
Yurong Jiang
Hongjing Li
Panpan Zhang
Yixiao He
Dandan Shi
Xiang Zhang
Jien Yang
spellingShingle Haifa Zhai
Yurong Jiang
Hongjing Li
Panpan Zhang
Yixiao He
Dandan Shi
Xiang Zhang
Jien Yang
In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
Heliyon
Condensed matter physics
Nanotechnology
Materials science
author_facet Haifa Zhai
Yurong Jiang
Hongjing Li
Panpan Zhang
Yixiao He
Dandan Shi
Xiang Zhang
Jien Yang
author_sort Haifa Zhai
title In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
title_short In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
title_full In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
title_fullStr In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
title_full_unstemmed In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals
title_sort in situ polarization and dielectric property measurements of pb(zr0.52ti0.48)o3 ferroelectric nanocrystals
publisher Elsevier
series Heliyon
issn 2405-8440
publishDate 2017-06-01
description Pb(Zr0.52Ti0.48)O3/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measurements for the first time. It’s found that 10% PZT/PC composite film has the largest orientation change and negligible dielectric relaxation after poling (the φ value of 13.8% is almost constant with time even for 168 h). Based on the XRD results, we consider that the preferential orientation of PZT nanocrystals to align in PC matrix after poling is [001] direction.
topic Condensed matter physics
Nanotechnology
Materials science
url http://www.sciencedirect.com/science/article/pii/S2405844017303250
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