Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410

Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410

Stripe rust, caused by <i>Puccinia striiformis</i> f. sp. <i>tritici</i> (<i>Pst</i>), is one of the most destructive diseases of wheat in the world. Genetic resistance is the best strategy for control of the disease. Spring wheat landrace PI 181410 has shown high...

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Bibliographic Details
Main Authors: Yan Liu, Yanmin Qie, Xing Li, Meinan Wang, Xianming Chen
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:International Journal of Molecular Sciences
Subjects:
disease resistance
<i>puccinia striiformis</i>
qtl mapping
stripe rust
<i>triticum aestivum</i>
wheat
Online Access:https://www.mdpi.com/1422-0067/21/2/478

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