Quantitative trait loci associated with resistance to gray leaf spot and grain yield in corn QTLs associados à resistência a cercosporiose e produção de grãos em milho

Quantitative trait loci associated with resistance to gray leaf spot and grain yield in corn QTLs associados à resistência a cercosporiose e produção de grãos em milho

The main objectives of hybrid development programs include incorporating genetic resistance to diseases and increasing grain yield. Identification of Quantitative Trait Loci (QTL) through the statistical analysis of molecular markers allows efficient selection of resistant and productive hybrids. Th...

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Bibliographic Details
Main Authors: Adriano Delly Veiga, Renzo Garcia Von Pinho, Luciane Vilela Resende, Édila Vilela de Resende Von Pinho, Márcio Balestre, Laís Andrade Pereira
Format: Article
Language:English
Published: Universidade Federal de Lavras 2012-02-01
Series:Ciência e Agrotecnologia
Subjects:
Máxima verossimilhança
microssatélites
regressão
Maximum likelihood
microsatellites
regression
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1413-70542012000100004

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http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1413-70542012000100004

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