Pixel modelling – a new age in SFX data analysis
Main Author: | Karol Nass |
---|---|
Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2020-11-01
|
Series: | IUCrJ |
Subjects: | |
Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252520014281 |
Similar Items
-
Making sense of SFX data: standards for data and structure validation for a non-standard experiment that has come of age
by: Clyde A. Smith
Published: (2021-07-01) -
The indexing ambiguity in serial femtosecond crystallography (SFX) resolved using an expectation maximization algorithm
by: Haiguang Liu, et al.
Published: (2014-11-01) -
De novo phasing with optimized XFEL data
by: Quan Hao
Published: (2016-05-01) -
Experimental phasing of serial femtosecond crystallography data
by: Ilme Schlichting
Published: (2017-09-01) -
Structural studies of P-type ATPase–ligand complexes using an X-ray free-electron laser
by: Maike Bublitz, et al.
Published: (2015-07-01)