Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum
We demonstrated spectral reflectometers for two types of reflectances, absolute and relative, of diffusely reflecting surfaces in directional-hemispherical geometry. Both are built based on the integrating sphere method with a Fourier-transform infrared spectrometer operating in a vacuum. The third...
Main Authors: | Jinhwa Gene, Min Yong Jeon, Sun Do Lim |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-02-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/21/4/1169 |
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