Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum

Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum

We demonstrated spectral reflectometers for two types of reflectances, absolute and relative, of diffusely reflecting surfaces in directional-hemispherical geometry. Both are built based on the integrating sphere method with a Fourier-transform infrared spectrometer operating in a vacuum. The third...

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Bibliographic Details
Main Authors: Jinhwa Gene, Min Yong Jeon, Sun Do Lim
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Sensors
Subjects:
mid-infrared
total reflectance
metrology
primary standard
3rd Taylor method
Online Access:https://www.mdpi.com/1424-8220/21/4/1169

Internet

https://www.mdpi.com/1424-8220/21/4/1169

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