Test for Reliability for Mission Critical Applications

Test for Reliability for Mission Critical Applications

Test for Reliability is a test flow where an Integrated Circuit (IC) device is continuously stressed under several corner conditions that can be dynamically adapted based on the real-time observation of the critical signals of the device during the evolution of the test. We present our approach for...

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Bibliographic Details
Main Authors: Mauro Pipponzi, Alberto Sangiovanni-Vincentelli
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Electronics
Subjects:
test
reliability
on-chip monitoring
Online Access:https://www.mdpi.com/2079-9292/10/16/1985
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spelling doaj-899365a269bb420f995a7c9f770514e82021-08-26T13:41:44ZengMDPI AGElectronics2079-92922021-08-01101985198510.3390/electronics10161985Test for Reliability for Mission Critical ApplicationsMauro Pipponzi0Alberto Sangiovanni-Vincentelli1ELES Semiconductor Equipment, 06059 Todi, ItalyDepartment of EECS, University of California, Berkeley, CA 94720, USATest for Reliability is a test flow where an Integrated Circuit (IC) device is continuously stressed under several corner conditions that can be dynamically adapted based on the real-time observation of the critical signals of the device during the evolution of the test. We present our approach for a successful Test-for-Reliability flow, going beyond the objectives of the traditional reliability approach, and covering the entire process from design to failure analysis.https://www.mdpi.com/2079-9292/10/16/1985testreliabilityon-chip monitoring
collection DOAJ
language English
format Article
sources DOAJ
author Mauro Pipponzi
Alberto Sangiovanni-Vincentelli
spellingShingle Mauro Pipponzi
Alberto Sangiovanni-Vincentelli
Test for Reliability for Mission Critical Applications
Electronics
test
reliability
on-chip monitoring
author_facet Mauro Pipponzi
Alberto Sangiovanni-Vincentelli
author_sort Mauro Pipponzi
title Test for Reliability for Mission Critical Applications
title_short Test for Reliability for Mission Critical Applications
title_full Test for Reliability for Mission Critical Applications
title_fullStr Test for Reliability for Mission Critical Applications
title_full_unstemmed Test for Reliability for Mission Critical Applications
title_sort test for reliability for mission critical applications
publisher MDPI AG
series Electronics
issn 2079-9292
publishDate 2021-08-01
description Test for Reliability is a test flow where an Integrated Circuit (IC) device is continuously stressed under several corner conditions that can be dynamically adapted based on the real-time observation of the critical signals of the device during the evolution of the test. We present our approach for a successful Test-for-Reliability flow, going beyond the objectives of the traditional reliability approach, and covering the entire process from design to failure analysis.
topic test
reliability
on-chip monitoring
url https://www.mdpi.com/2079-9292/10/16/1985
work_keys_str_mv AT mauropipponzi testforreliabilityformissioncriticalapplications
AT albertosangiovannivincentelli testforreliabilityformissioncriticalapplications
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