A Novel Fault Identification Method for Photovoltaic Array via Convolutional Neural Network and Residual Gated Recurrent Unit

• Main Authors: Wei Gao, Rong-Jong Wai
• Format: Article
• Language: English
• Published: IEEE 2020-01-01
• Series: IEEE Access
• Subjects: Photovoltaic; fault diagnosis; I-V curve; 1-dimensional convolutional neural network (1-D CNN); residual-gated recurrent unit (Res-GRU)
• Online Access: https://ieeexplore.ieee.org/document/9180283/

Under the background of the large-scale construction of photovoltaic (PV) power stations, it is crucial to discover and solve module failures in time for improving the service life and maintaining the normal operation efficiency of modules. Based on analyzing the difference of I-V curves of PV arrays under different fault states, the I-V curves, temperatures and irradiances are taken as input data, and a fusion model of convolutional neural network (CNN) and residual-gated recurrent unit (Res-GRU) is proposed to identify the PV array fault. This model consists of a 1-dimensional CNN module with a 4-layer structure and a Res-GRU module. It has the advantages of end-to-end fault diagnosis, no manual feature extraction, strong anti-interference ability, and usable in the absence of irradiances and temperatures. Moreover, it can not only identify a single fault (e.g., short circuit, partial shading, abnormal aging, etc.), but also can effectively identify hybrid faults. Experimental results show that the classification accuracy of the proposed method is 98.61%, which is better than the ones of the artificial neural network (ANN), the extreme learning machine with kernel function (KELM), the fuzzy C-mean (FCM) clustering, the residual neural network (ResNet), and the stage-wise additive modeling using multi-class exponential loss function based on the classification and regression tree (SAMME-CART). In addition, in the absence of temperatures and irradiances, the classification accuracy still reaches 95.23%, which has a broad application prospect in the online fault diagnoses of PV arrays.