Radiation Response of Negative Gate Biased SiC MOSFETs

Silicon carbide (SiC) metal-oxide-semiconductor field effect transistors (MOSFETs) are expected as power electronic devices for high radiative conditions, including nuclear plants and space. Radiation response of commercial-grade prototype SiC MOSFETs with applying the gate bias is of interest, in t...

Full description

Bibliographic Details
Main Authors: Akinori Takeyama, Takahiro Makino, Shuichi Okubo, Yuki Tanaka, Toru Yoshie, Yasuto Hijikata, Takeshi Ohshima
Format: Article
Language:English
Published: MDPI AG 2019-08-01
Series:Materials
Subjects:
SiC
Online Access:https://www.mdpi.com/1996-1944/12/17/2741

Similar Items