First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required t...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
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| Series: | Processes |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2227-9717/8/11/1520 |