On the ionization loss spectra of high-energy channeled negatively charged particles
Abstract The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length $$l_d$$ ld is considered. It...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2020-07-01
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| Series: | European Physical Journal C: Particles and Fields |
| Online Access: | http://link.springer.com/article/10.1140/epjc/s10052-020-8127-z |
| Summary: | Abstract The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length $$l_d$$ ld is considered. It is shown that in this case the shape of the spectrum noticeably depends on $$l_d$$ ld . The evolution of various characteristic parameters of the spectrum with the change of $$l_d$$ ld is investigated. A method of the experimental determination of $$l_d$$ ld on the basis of the measurement of the ionization loss spectrum is proposed. |
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| ISSN: | 1434-6044 1434-6052 |