Challenges and complexities of multifrequency atomic force microscopy in liquid environments
This paper illustrates through numerical simulation the complexities encountered in high-damping AFM imaging, as in liquid enviroments, within the specific context of multifrequency atomic force microscopy (AFM). The focus is primarily on (i) the amplitude and phase relaxation of driven higher eigen...
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2014-03-01
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| Series: | Beilstein Journal of Nanotechnology |
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| Online Access: | https://doi.org/10.3762/bjnano.5.33 |