Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt

Bibliographic Details
Main Authors: Mitev, Pavlin D., Saito, Masatoshi, Waseda, Yoshio, Sato, Yuzuru
Format: Article
Language:English
Published: De Gruyter 2000-08-01
Series:High Temperature Materials and Processes
Online Access:https://doi.org/10.1515/HTMP.2000.19.5.307
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spelling doaj-8541725a6ce341dd8d016560ca6572fe2021-09-06T19:19:09ZengDe GruyterHigh Temperature Materials and Processes0334-64552191-03242000-08-0119530731210.1515/HTMP.2000.19.5.307Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon MeltMitev, Pavlin D.Saito, MasatoshiWaseda, YoshioSato, Yuzuruhttps://doi.org/10.1515/HTMP.2000.19.5.307
collection DOAJ
language English
format Article
sources DOAJ
author Mitev, Pavlin D.
Saito, Masatoshi
Waseda, Yoshio
Sato, Yuzuru
spellingShingle Mitev, Pavlin D.
Saito, Masatoshi
Waseda, Yoshio
Sato, Yuzuru
Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
High Temperature Materials and Processes
author_facet Mitev, Pavlin D.
Saito, Masatoshi
Waseda, Yoshio
Sato, Yuzuru
author_sort Mitev, Pavlin D.
title Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
title_short Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
title_full Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
title_fullStr Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
title_full_unstemmed Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt
title_sort theoretical estimation of diffusion coefficients of impurities in silicon melt
publisher De Gruyter
series High Temperature Materials and Processes
issn 0334-6455
2191-0324
publishDate 2000-08-01
url https://doi.org/10.1515/HTMP.2000.19.5.307
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AT satoyuzuru theoreticalestimationofdiffusioncoefficientsofimpuritiesinsiliconmelt
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