Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system

The dataset describes the mechanism of suppressing the background noise of the divided-aperture differential confocal Raman microscopy system and the range of tilting angles that the system can handle. On the basis of the confocal microscopy (CM), the divided-aperture confocal microscopy divided the...

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Main Authors: Yunhao Su, Ruirui Zhang, Hanxu Wu, Lirong Qiu, He Ni, Ke-Mi Xu, Weiqian Zhao
Format: Article
Language:English
Published: Elsevier 2021-06-01
Series:Data in Brief
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2352340921004169
id doaj-831db81250c548af9270912b500338e8
record_format Article
spelling doaj-831db81250c548af9270912b500338e82021-06-27T04:38:28ZengElsevierData in Brief2352-34092021-06-0136107132Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy systemYunhao Su0Ruirui Zhang1Hanxu Wu2Lirong Qiu3He Ni4Ke-Mi Xu5Weiqian Zhao6Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, ChinaBeijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, ChinaBeijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, ChinaBeijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China; Corresponding authors.Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, ChinaBeijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China; Corresponding authors.Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China; Research Center for Intelligent Sensing, Zhijiang Lab, Hangzhou 311100,ChinaThe dataset describes the mechanism of suppressing the background noise of the divided-aperture differential confocal Raman microscopy system and the range of tilting angles that the system can handle. On the basis of the confocal microscopy (CM), the divided-aperture confocal microscopy divided the pupil plane of the objective lens into the illumination pupil and collection pupil. Compared with the CM, the divided-aperture confocal microscopy only changes the pupil parameters, according to the partially coherent imaging theory, we simulate and analyze the axial response curves of the divided-aperture confocal system and the traditional confocal system. We also simulated the differential confocal response curve at different tilting angles and get the data for the applicability of the differential confocal response curve to see if there is a single zero-crossing point or a good linearity near the zero-crossing point. The goodness-of-fit (GOF) is used to evaluate the accuracy of linear fitting, and can be used as a simple measure method of linearity. And the closer the GOF value is to 1, the higher fitting accuracy is. Through simulation analysis, we can have a better understanding of the advances of divided-aperture differential confocal Raman microscopy.http://www.sciencedirect.com/science/article/pii/S2352340921004169Suppressing background noiseTilting anglesDivided-aperture differential confocal Raman microscopyAxial response curvesGoodness-of-fit (GOF)
collection DOAJ
language English
format Article
sources DOAJ
author Yunhao Su
Ruirui Zhang
Hanxu Wu
Lirong Qiu
He Ni
Ke-Mi Xu
Weiqian Zhao
spellingShingle Yunhao Su
Ruirui Zhang
Hanxu Wu
Lirong Qiu
He Ni
Ke-Mi Xu
Weiqian Zhao
Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
Data in Brief
Suppressing background noise
Tilting angles
Divided-aperture differential confocal Raman microscopy
Axial response curves
Goodness-of-fit (GOF)
author_facet Yunhao Su
Ruirui Zhang
Hanxu Wu
Lirong Qiu
He Ni
Ke-Mi Xu
Weiqian Zhao
author_sort Yunhao Su
title Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
title_short Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
title_full Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
title_fullStr Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
title_full_unstemmed Dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal Raman microscopy system
title_sort dataset on capability of suppressing background noise and anti-tilting of divided-aperture differential confocal raman microscopy system
publisher Elsevier
series Data in Brief
issn 2352-3409
publishDate 2021-06-01
description The dataset describes the mechanism of suppressing the background noise of the divided-aperture differential confocal Raman microscopy system and the range of tilting angles that the system can handle. On the basis of the confocal microscopy (CM), the divided-aperture confocal microscopy divided the pupil plane of the objective lens into the illumination pupil and collection pupil. Compared with the CM, the divided-aperture confocal microscopy only changes the pupil parameters, according to the partially coherent imaging theory, we simulate and analyze the axial response curves of the divided-aperture confocal system and the traditional confocal system. We also simulated the differential confocal response curve at different tilting angles and get the data for the applicability of the differential confocal response curve to see if there is a single zero-crossing point or a good linearity near the zero-crossing point. The goodness-of-fit (GOF) is used to evaluate the accuracy of linear fitting, and can be used as a simple measure method of linearity. And the closer the GOF value is to 1, the higher fitting accuracy is. Through simulation analysis, we can have a better understanding of the advances of divided-aperture differential confocal Raman microscopy.
topic Suppressing background noise
Tilting angles
Divided-aperture differential confocal Raman microscopy
Axial response curves
Goodness-of-fit (GOF)
url http://www.sciencedirect.com/science/article/pii/S2352340921004169
work_keys_str_mv AT yunhaosu datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT ruiruizhang datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT hanxuwu datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT lirongqiu datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT heni datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT kemixu datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
AT weiqianzhao datasetoncapabilityofsuppressingbackgroundnoiseandantitiltingofdividedaperturedifferentialconfocalramanmicroscopysystem
_version_ 1721358528755531776