CHARACTERISTICS OF A THIN CONDUCTIVE FILM BY PLASMON RESONANCES

Purpose. The paper describes and studies a method for determining the characteristics of thin flat conducting films based on the use of plasmon resonances. Methodology and Approach. The dependences of the reflection and transmission coefficients of radiation on the frequency for a thin conducting fi...

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Bibliographic Details
Main Authors: Зверев Николай Витальевич, Зотов Александр Александрович, Юшканов Александр Алексеевич
Format: Article
Language:Russian
Published: Moscow Region State University Editorial Office 2020-07-01
Series:Вестник московского государственного областного университета. Серия: Физика-математика
Subjects:
Online Access:http://vestnik-mgou.ru/Articles/View/13776