Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications
Atomic layer deposition (ALD) is a chemical vapor deposition (CVD) deposition method in<br />which high-quality [...]
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doaj-82e2b40d2694447cb8b09aa315b1bbac2020-11-24T21:20:18ZengMDPI AGProceedings2504-39002019-06-011412710.3390/proceedings2019014027proceedings2019014027Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing ApplicationsEngin Ciftyurek0Martin Wilken1David Zanders2Lukas Mai3Anjana Devi4Klaus D. Schierbaum5Department of Materials Science, Institute for Experimental Condensed Matter Physics, Heinrich Heine University of Duesseldorf, 40225 Düsseldorf, GermanyInorganic Materials Chemistry, Ruhr University Bochum, 44801 Bochum, GermanyInorganic Materials Chemistry, Ruhr University Bochum, 44801 Bochum, GermanyInorganic Materials Chemistry, Ruhr University Bochum, 44801 Bochum, GermanyInorganic Materials Chemistry, Ruhr University Bochum, 44801 Bochum, GermanyDepartment of Materials Science, Institute for Experimental Condensed Matter Physics, Heinrich Heine University of Duesseldorf, 40225 Düsseldorf, GermanyAtomic layer deposition (ALD) is a chemical vapor deposition (CVD) deposition method in<br />which high-quality [...]https://www.mdpi.com/2504-3900/14/1/27n/a |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Engin Ciftyurek Martin Wilken David Zanders Lukas Mai Anjana Devi Klaus D. Schierbaum |
spellingShingle |
Engin Ciftyurek Martin Wilken David Zanders Lukas Mai Anjana Devi Klaus D. Schierbaum Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications Proceedings n/a |
author_facet |
Engin Ciftyurek Martin Wilken David Zanders Lukas Mai Anjana Devi Klaus D. Schierbaum |
author_sort |
Engin Ciftyurek |
title |
Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications |
title_short |
Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications |
title_full |
Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications |
title_fullStr |
Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications |
title_full_unstemmed |
Monitoring Surface Stoichiometry, Work Function and Valance Band of Tungsten Oxide (WO<sub>3</sub>), Molybdenum Oxide (MoO<sub>3</sub>) and Tin Oxide (SnO<sub>2</sub>) Thin Films as a Function of Temperature and Oxygen Partial Pressure with Advanced Surface Sensitive Techniques for Chemical Sensing Applications |
title_sort |
monitoring surface stoichiometry, work function and valance band of tungsten oxide (wo<sub>3</sub>), molybdenum oxide (moo<sub>3</sub>) and tin oxide (sno<sub>2</sub>) thin films as a function of temperature and oxygen partial pressure with advanced surface sensitive techniques for chemical sensing applications |
publisher |
MDPI AG |
series |
Proceedings |
issn |
2504-3900 |
publishDate |
2019-06-01 |
description |
Atomic layer deposition (ALD) is a chemical vapor deposition (CVD) deposition method in<br />which high-quality [...] |
topic |
n/a |
url |
https://www.mdpi.com/2504-3900/14/1/27 |
work_keys_str_mv |
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