Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)

This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate...

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Main Authors:	Alexander Syuy, Dmitriy Shtarev, Victor Krishtop, Natalia Kireeva
Format:	Article
Language:	English
Published:	Hindawi Limited 2013-01-01
Series:	Journal of Spectroscopy
Online Access:	http://dx.doi.org/10.1155/2013/875809

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spelling	doaj-800ddd2e4a234d0982fe52e6d842d8962020-11-24T23:14:23ZengHindawi LimitedJournal of Spectroscopy2314-49202314-49392013-01-01201310.1155/2013/875809875809Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)Alexander Syuy0Dmitriy Shtarev1Victor Krishtop2Natalia Kireeva3Physics Department, Far Eastern State Transport University, 47 Seryshev Street, Khabarovsk 680021, RussiaPhysics Department, Far Eastern State Transport University, 47 Seryshev Street, Khabarovsk 680021, RussiaPhysics Department, Far Eastern State Transport University, 47 Seryshev Street, Khabarovsk 680021, RussiaPhysics Department, Far Eastern State Transport University, 47 Seryshev Street, Khabarovsk 680021, RussiaThis work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates of λ/4 or λ/2) and the examined plate by the intensity of the transmitted radiation. Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes. The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.http://dx.doi.org/10.1155/2013/875809
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Alexander Syuy Dmitriy Shtarev Victor Krishtop Natalia Kireeva
spellingShingle	Alexander Syuy Dmitriy Shtarev Victor Krishtop Natalia Kireeva Conformity Check of Thickness to the Crystal Plate λ/4(λ/2) Journal of Spectroscopy
author_facet	Alexander Syuy Dmitriy Shtarev Victor Krishtop Natalia Kireeva
author_sort	Alexander Syuy
title	Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)
title_short	Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)
title_full	Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)
title_fullStr	Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)
title_full_unstemmed	Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)
title_sort	conformity check of thickness to the crystal plate λ/4(λ/2)
publisher	Hindawi Limited
series	Journal of Spectroscopy
issn	2314-4920 2314-4939
publishDate	2013-01-01
description	This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates of λ/4 or λ/2) and the examined plate by the intensity of the transmitted radiation. Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes. The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.
url	http://dx.doi.org/10.1155/2013/875809
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Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)

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