Detection and Characterization Method for Interface Bonding Defects of New Composite Materials

The defects such as voids and debonding within the bonding interface between the composite and the substrate are the key factors affecting the safe use of materials. In this study, Industrial Computed Tomography (ICT) was used to perform non-destructive tests of bonding defects. High-precision chara...

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Bibliographic Details
Main Authors: Yintang Wen, Song Zhang, Yuyan Zhang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8813064/

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