STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD

The image of subsurface with a migration method keeps on developing to get an image result which the closest in real condition. The conditions in subsurface are very complex and variables it couses the process of wave  propagation which can not be judged as the same in every layers. so it is needed...

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Main Authors: Husni Cahyadi Kurniawan, Adi Susilo, Teguh Suroso
Format: Article
Language:English
Published: Sebelas Maret University 2017-02-01
Series:Indonesian Journal of Applied Physics
Online Access:https://jurnal.uns.ac.id/ijap/article/view/1422
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spelling doaj-7ea23529a16b476e9c5f58d7b2ca828d2020-11-24T20:52:28ZengSebelas Maret UniversityIndonesian Journal of Applied Physics2089-01332477-64162017-02-01602798710.13057/ijap.v6i02.14224260STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHODHusni Cahyadi Kurniawan0Adi Susilo1Teguh SurosoBrawijaya UniversityBrawijaya UniversityThe image of subsurface with a migration method keeps on developing to get an image result which the closest in real condition. The conditions in subsurface are very complex and variables it couses the process of wave  propagation which can not be judged as the same in every layers. so it is needed an anisotropy pharameter analysiz (η) in seismic data migration process. The research will compare two kinds of migrations those are Kirchhoff migration and finite difference anisotropy. It is done because not all datas are processed by anisotropy, even with isotropi it will get good result. The result of kirchoff migration has not so good quality (low resolution) on the first layer reflector.but on the second and third layer reflector have good result (high resolution). I estimate that in the first layer reflector there is anistropi influence, because the ratio effect between far offset and the depth is hight. The analysis result get η ansotropi pharameter result as 0,25 and put into migration process. On the second migration process is finite difference anisotropy appears on the first layer reflector and shows high resolution and suitable with the real layer model.https://jurnal.uns.ac.id/ijap/article/view/1422
collection DOAJ
language English
format Article
sources DOAJ
author Husni Cahyadi Kurniawan
Adi Susilo
Teguh Suroso
spellingShingle Husni Cahyadi Kurniawan
Adi Susilo
Teguh Suroso
STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
Indonesian Journal of Applied Physics
author_facet Husni Cahyadi Kurniawan
Adi Susilo
Teguh Suroso
author_sort Husni Cahyadi Kurniawan
title STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
title_short STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
title_full STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
title_fullStr STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
title_full_unstemmed STRUCTURE MODELLING OF SUBSURFACE BY USING KIRCHHOFF MIGRATION METHOD AND FINITE DIFFERENCE ANISOTROPY METHOD
title_sort structure modelling of subsurface by using kirchhoff migration method and finite difference anisotropy method
publisher Sebelas Maret University
series Indonesian Journal of Applied Physics
issn 2089-0133
2477-6416
publishDate 2017-02-01
description The image of subsurface with a migration method keeps on developing to get an image result which the closest in real condition. The conditions in subsurface are very complex and variables it couses the process of wave  propagation which can not be judged as the same in every layers. so it is needed an anisotropy pharameter analysiz (η) in seismic data migration process. The research will compare two kinds of migrations those are Kirchhoff migration and finite difference anisotropy. It is done because not all datas are processed by anisotropy, even with isotropi it will get good result. The result of kirchoff migration has not so good quality (low resolution) on the first layer reflector.but on the second and third layer reflector have good result (high resolution). I estimate that in the first layer reflector there is anistropi influence, because the ratio effect between far offset and the depth is hight. The analysis result get η ansotropi pharameter result as 0,25 and put into migration process. On the second migration process is finite difference anisotropy appears on the first layer reflector and shows high resolution and suitable with the real layer model.
url https://jurnal.uns.ac.id/ijap/article/view/1422
work_keys_str_mv AT husnicahyadikurniawan structuremodellingofsubsurfacebyusingkirchhoffmigrationmethodandfinitedifferenceanisotropymethod
AT adisusilo structuremodellingofsubsurfacebyusingkirchhoffmigrationmethodandfinitedifferenceanisotropymethod
AT teguhsuroso structuremodellingofsubsurfacebyusingkirchhoffmigrationmethodandfinitedifferenceanisotropymethod
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