STUDY OF MECHANISMS RESPONSIBLE FOR THE EFFICIENCY DEGRADATION OF THE III-NITRIDES LIGHT EMITTING DIODES

STUDY OF MECHANISMS RESPONSIBLE FOR THE EFFICIENCY DEGRADATION OF THE III-NITRIDES LIGHT EMITTING DIODES

The results for external quantum efficiency degradation of two types of light emitting diodes based on III-nitrides: blue and ultraviolet ones are presented. Existing mechanisms proposed for the degradation are considered briefly. Applying several techniques for studying the light emitting diodes at...

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Bibliographic Details
Main Authors: N. M. Shmidt, A. S. Usikov, E. I. Shabunina, A. E. Chernyakov, S. Y. Kurin, Y. N. Makarov, H. I. Helava, B. P. Papchenko
Format: Article
Language:English
Published: Saint Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO University) 2015-01-01
Series:Naučno-tehničeskij Vestnik Informacionnyh Tehnologij, Mehaniki i Optiki
Subjects:
light emitting diodes based on III-nitrides
system of extended defects
mechanisms of defects generation
degradation
Online Access:http://ntv.ifmo.ru/file/article/11436.pdf

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http://ntv.ifmo.ru/file/article/11436.pdf

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