Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio

Gate-all-around (GAA) field effect transistors (FETs) have appeared as one of the potential candidates for the electrostatic integrity required to reduce MOSFETs to minimum channel lengths. Meanwhile, the negative capacitance effect of ferroelectrics is known as a remarkable quality enhancer for MOS...

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Main Authors: Kamal Hosen, Md. Sherajul Islam, Catherine Stampfl, Jeongwon Park
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9514875/
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spelling doaj-7e1bd9055e9347cdb1564059dabddf2d2021-08-27T23:01:06ZengIEEEIEEE Access2169-35362021-01-01911625411626410.1109/ACCESS.2021.31053419514875Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off RatioKamal Hosen0https://orcid.org/0000-0003-2804-397XMd. Sherajul Islam1https://orcid.org/0000-0002-6717-2523Catherine Stampfl2Jeongwon Park3https://orcid.org/0000-0003-4988-302XDepartment of Electrical and Electronic Engineering, Khulna University of Engineering &#x0026; Technology, Khulna, BangladeshDepartment of Electrical and Electronic Engineering, Khulna University of Engineering &#x0026; Technology, Khulna, BangladeshSchool of Physics, The University of Sydney, Sydney, Camperdown NSW, AustraliaDepartment of Electrical and Biomedical Engineering, University of Nevada at Reno, Reno, NV, USAGate-all-around (GAA) field effect transistors (FETs) have appeared as one of the potential candidates for the electrostatic integrity required to reduce MOSFETs to minimum channel lengths. Meanwhile, the negative capacitance effect of ferroelectrics is known as a remarkable quality enhancer for MOSFETs in terms of reducing sub-threshold slope (SS), supply voltage, and power consumption by utilizing the gate voltage amplification phenomenon. In this work, combining these two phenomena we numerically design a cylindrical GAA NCFET where promising two-dimensional WSe<sub>2</sub> is used as a channel material. We have suggested a high-K dielectric consisting of a tri-layer HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> and lead zirconate titanate (PZT) as a ferroelectric layer in the gate stacking. The extremely high <inline-formula> <tex-math notation="LaTeX">$I_{on}/I_{off}$ </tex-math></inline-formula> ratio on the order of 10<sup>12</sup> (six order higher than conventional FET), and the high on-state current of <inline-formula> <tex-math notation="LaTeX">$119~\mu \text{A}$ </tex-math></inline-formula> are the most remarkable findings of this device which exceeds all the earlier results. The integration of the NC effect utilizing a 20 nm PZT offers lowest <inline-formula> <tex-math notation="LaTeX">$SS$ </tex-math></inline-formula> of 18.9 mV/dec. Moreover, a large transconductance (<inline-formula> <tex-math notation="LaTeX">$g_{m}$ </tex-math></inline-formula>) of <inline-formula> <tex-math notation="LaTeX">$117~\mu \text{S}$ </tex-math></inline-formula> and a higher current cut-off frequency (<inline-formula> <tex-math notation="LaTeX">$f_{T}$ </tex-math></inline-formula>) of 335 GHz were reported from the output characteristics. These outcomes allude that the suggested device structure may create a new path for electronic devices; therefore, it can be used for high speed operation with low power consumption.https://ieeexplore.ieee.org/document/9514875/Field effect transistorferroelectric materialsgate-all-around2D materialsnegative capacitance
collection DOAJ
language English
format Article
sources DOAJ
author Kamal Hosen
Md. Sherajul Islam
Catherine Stampfl
Jeongwon Park
spellingShingle Kamal Hosen
Md. Sherajul Islam
Catherine Stampfl
Jeongwon Park
Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
IEEE Access
Field effect transistor
ferroelectric materials
gate-all-around
2D materials
negative capacitance
author_facet Kamal Hosen
Md. Sherajul Islam
Catherine Stampfl
Jeongwon Park
author_sort Kamal Hosen
title Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
title_short Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
title_full Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
title_fullStr Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
title_full_unstemmed Numerical Analysis of Gate-All-Around HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> High-K Dielectric Based WSe<sub>2</sub> NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio
title_sort numerical analysis of gate-all-around hfo<sub>2</sub>/tio<sub>2</sub>/hfo<sub>2</sub> high-k dielectric based wse<sub>2</sub> ncfet with reduced sub-threshold swing and high on/off ratio
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2021-01-01
description Gate-all-around (GAA) field effect transistors (FETs) have appeared as one of the potential candidates for the electrostatic integrity required to reduce MOSFETs to minimum channel lengths. Meanwhile, the negative capacitance effect of ferroelectrics is known as a remarkable quality enhancer for MOSFETs in terms of reducing sub-threshold slope (SS), supply voltage, and power consumption by utilizing the gate voltage amplification phenomenon. In this work, combining these two phenomena we numerically design a cylindrical GAA NCFET where promising two-dimensional WSe<sub>2</sub> is used as a channel material. We have suggested a high-K dielectric consisting of a tri-layer HfO<sub>2</sub>/TiO<sub>2</sub>/HfO<sub>2</sub> and lead zirconate titanate (PZT) as a ferroelectric layer in the gate stacking. The extremely high <inline-formula> <tex-math notation="LaTeX">$I_{on}/I_{off}$ </tex-math></inline-formula> ratio on the order of 10<sup>12</sup> (six order higher than conventional FET), and the high on-state current of <inline-formula> <tex-math notation="LaTeX">$119~\mu \text{A}$ </tex-math></inline-formula> are the most remarkable findings of this device which exceeds all the earlier results. The integration of the NC effect utilizing a 20 nm PZT offers lowest <inline-formula> <tex-math notation="LaTeX">$SS$ </tex-math></inline-formula> of 18.9 mV/dec. Moreover, a large transconductance (<inline-formula> <tex-math notation="LaTeX">$g_{m}$ </tex-math></inline-formula>) of <inline-formula> <tex-math notation="LaTeX">$117~\mu \text{S}$ </tex-math></inline-formula> and a higher current cut-off frequency (<inline-formula> <tex-math notation="LaTeX">$f_{T}$ </tex-math></inline-formula>) of 335 GHz were reported from the output characteristics. These outcomes allude that the suggested device structure may create a new path for electronic devices; therefore, it can be used for high speed operation with low power consumption.
topic Field effect transistor
ferroelectric materials
gate-all-around
2D materials
negative capacitance
url https://ieeexplore.ieee.org/document/9514875/
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