Parasitic Events in Envelope Analysis

Envelope analysis allows fast fault location of individual gearboxes and parts of bearings by repetition frequency determination of the mechanical catch of an amplitude-modulated signal. Systematic faults arise when using envelope analysis on a signal with strong changes. The source of these events...

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Main Authors: J. Doubek, M. Kreidl
Format: Article
Language:English
Published: CTU Central Library 2001-01-01
Series:Acta Polytechnica
Subjects:
Online Access:https://ojs.cvut.cz/ojs/index.php/ap/article/view/282
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spelling doaj-7dafd66eabf741b5aa785e0cc4682a552020-11-24T21:06:30ZengCTU Central LibraryActa Polytechnica1210-27091805-23632001-01-01416282Parasitic Events in Envelope AnalysisJ. DoubekM. KreidlEnvelope analysis allows fast fault location of individual gearboxes and parts of bearings by repetition frequency determination of the mechanical catch of an amplitude-modulated signal. Systematic faults arise when using envelope analysis on a signal with strong changes. The source of these events is the range of function definition of used in convolution integral definition. This integral is used for Hilbert image calculation of analyzed signal. Overshoots (almost similar to Gibbs events on a synthetic signal using the Fourier series) are result from these faults. Overshoots are caused by parasitic spectral lines in the frequency domain, which can produce faulty diagnostic analysis.This paper describes systematic arising during faults rising by signal numerical calculation using envelope analysis with Hilbert transform. It goes on to offer a mathematical analysis of these systematic faults.https://ojs.cvut.cz/ojs/index.php/ap/article/view/282gearboxbearingenvelope analysisHilbert transformparasitic spectral lines
collection DOAJ
language English
format Article
sources DOAJ
author J. Doubek
M. Kreidl
spellingShingle J. Doubek
M. Kreidl
Parasitic Events in Envelope Analysis
Acta Polytechnica
gearbox
bearing
envelope analysis
Hilbert transform
parasitic spectral lines
author_facet J. Doubek
M. Kreidl
author_sort J. Doubek
title Parasitic Events in Envelope Analysis
title_short Parasitic Events in Envelope Analysis
title_full Parasitic Events in Envelope Analysis
title_fullStr Parasitic Events in Envelope Analysis
title_full_unstemmed Parasitic Events in Envelope Analysis
title_sort parasitic events in envelope analysis
publisher CTU Central Library
series Acta Polytechnica
issn 1210-2709
1805-2363
publishDate 2001-01-01
description Envelope analysis allows fast fault location of individual gearboxes and parts of bearings by repetition frequency determination of the mechanical catch of an amplitude-modulated signal. Systematic faults arise when using envelope analysis on a signal with strong changes. The source of these events is the range of function definition of used in convolution integral definition. This integral is used for Hilbert image calculation of analyzed signal. Overshoots (almost similar to Gibbs events on a synthetic signal using the Fourier series) are result from these faults. Overshoots are caused by parasitic spectral lines in the frequency domain, which can produce faulty diagnostic analysis.This paper describes systematic arising during faults rising by signal numerical calculation using envelope analysis with Hilbert transform. It goes on to offer a mathematical analysis of these systematic faults.
topic gearbox
bearing
envelope analysis
Hilbert transform
parasitic spectral lines
url https://ojs.cvut.cz/ojs/index.php/ap/article/view/282
work_keys_str_mv AT jdoubek parasiticeventsinenvelopeanalysis
AT mkreidl parasiticeventsinenvelopeanalysis
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