Effect of the Incoherent Encapsulation Layer and Oblique Sunlight Incidence on the Optical and Current-Voltage Characteristics of Surface-Textured Cu(In,Ga)Se<sub>2</sub> Solar Cells Based on the Angle-Dependent Equispaced Thickness Averaging Method

In general, the optical and electrical characteristics of Cu(In,Ga)Se<sub>2</sub> (CIGS) solar cells have been studied under the condition that sunlight is normally incident from the air to the CIGS solar cell having no thick front encapsulation layers. To obtain the calculation results...

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Bibliographic Details
Main Authors: Gyeongjun Lee, Jiyong Kim, Sungchul Kim, Jungho Kim
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/11/5/2121
Description
Summary:In general, the optical and electrical characteristics of Cu(In,Ga)Se<sub>2</sub> (CIGS) solar cells have been studied under the condition that sunlight is normally incident from the air to the CIGS solar cell having no thick front encapsulation layers. To obtain the calculation results in a realistic module application, we calculate the optical and current–voltage (J–V) characteristics of surface-textured CIGS solar cells by simultaneously considering the thick front encapsulation layers and oblique sunlight incidence. Using the proposed angle-dependent equispaced thickness averaging method (ADETAM), we incoherently model two successive front encapsulation layers of a cover glass layer and an ethylene vinyl acetate (EVA) layer, whose respective thicknesses are greater than the coherence length of sunlight (~0.6 μm). The angular dependences of reflectance spectrum and J–V curves are calculated and compared in a surface-textured CIGS solar cell with and without the inclusion of the two front encapsulation layers. We show that the optical absorption improvement of the surface-textured CIGS solar cell over the planar CIGS solar cell can be over-predicted when the thick front encapsulation layers are not considered in the optical modeling.
ISSN:2076-3417