High dislocation density of tin induced by electric current
A dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattere...
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2015-12-01
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Online Access: | http://dx.doi.org/10.1063/1.4937909 |
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doaj-7a806336cac14806b90ded9bb68b3c112020-11-24T20:48:54ZengAIP Publishing LLCAIP Advances2158-32262015-12-01512127210127210-610.1063/1.4937909022512ADVHigh dislocation density of tin induced by electric currentYi-Han Liao0Chien-Lung Liang1Kwang-Lung Lin2Albert T. Wu3Department of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Chemical and Material Engineering, National Central University, Jhongli 32001, Taiwan, R. O. CA dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattered Diffraction images reflect that the high dislocation density induced the formation of low deflection angle subgrains, high deflection angle Widmanstätten grains, and recrystallization. The recrystallization gave rise to grain refining.http://dx.doi.org/10.1063/1.4937909 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Yi-Han Liao Chien-Lung Liang Kwang-Lung Lin Albert T. Wu |
spellingShingle |
Yi-Han Liao Chien-Lung Liang Kwang-Lung Lin Albert T. Wu High dislocation density of tin induced by electric current AIP Advances |
author_facet |
Yi-Han Liao Chien-Lung Liang Kwang-Lung Lin Albert T. Wu |
author_sort |
Yi-Han Liao |
title |
High dislocation density of tin induced by electric current |
title_short |
High dislocation density of tin induced by electric current |
title_full |
High dislocation density of tin induced by electric current |
title_fullStr |
High dislocation density of tin induced by electric current |
title_full_unstemmed |
High dislocation density of tin induced by electric current |
title_sort |
high dislocation density of tin induced by electric current |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2015-12-01 |
description |
A dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattered Diffraction images reflect that the high dislocation density induced the formation of low deflection angle subgrains, high deflection angle Widmanstätten grains, and recrystallization. The recrystallization gave rise to grain refining. |
url |
http://dx.doi.org/10.1063/1.4937909 |
work_keys_str_mv |
AT yihanliao highdislocationdensityoftininducedbyelectriccurrent AT chienlungliang highdislocationdensityoftininducedbyelectriccurrent AT kwanglunglin highdislocationdensityoftininducedbyelectriccurrent AT alberttwu highdislocationdensityoftininducedbyelectriccurrent |
_version_ |
1716807547886764032 |