High dislocation density of tin induced by electric current

A dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattere...

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Main Authors: Yi-Han Liao, Chien-Lung Liang, Kwang-Lung Lin, Albert T. Wu
Format: Article
Language:English
Published: AIP Publishing LLC 2015-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4937909
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spelling doaj-7a806336cac14806b90ded9bb68b3c112020-11-24T20:48:54ZengAIP Publishing LLCAIP Advances2158-32262015-12-01512127210127210-610.1063/1.4937909022512ADVHigh dislocation density of tin induced by electric currentYi-Han Liao0Chien-Lung Liang1Kwang-Lung Lin2Albert T. Wu3Department of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Material Science and Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R. O. CDepartment of Chemical and Material Engineering, National Central University, Jhongli 32001, Taiwan, R. O. CA dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattered Diffraction images reflect that the high dislocation density induced the formation of low deflection angle subgrains, high deflection angle Widmanstätten grains, and recrystallization. The recrystallization gave rise to grain refining.http://dx.doi.org/10.1063/1.4937909
collection DOAJ
language English
format Article
sources DOAJ
author Yi-Han Liao
Chien-Lung Liang
Kwang-Lung Lin
Albert T. Wu
spellingShingle Yi-Han Liao
Chien-Lung Liang
Kwang-Lung Lin
Albert T. Wu
High dislocation density of tin induced by electric current
AIP Advances
author_facet Yi-Han Liao
Chien-Lung Liang
Kwang-Lung Lin
Albert T. Wu
author_sort Yi-Han Liao
title High dislocation density of tin induced by electric current
title_short High dislocation density of tin induced by electric current
title_full High dislocation density of tin induced by electric current
title_fullStr High dislocation density of tin induced by electric current
title_full_unstemmed High dislocation density of tin induced by electric current
title_sort high dislocation density of tin induced by electric current
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2015-12-01
description A dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattered Diffraction images reflect that the high dislocation density induced the formation of low deflection angle subgrains, high deflection angle Widmanstätten grains, and recrystallization. The recrystallization gave rise to grain refining.
url http://dx.doi.org/10.1063/1.4937909
work_keys_str_mv AT yihanliao highdislocationdensityoftininducedbyelectriccurrent
AT chienlungliang highdislocationdensityoftininducedbyelectriccurrent
AT kwanglunglin highdislocationdensityoftininducedbyelectriccurrent
AT alberttwu highdislocationdensityoftininducedbyelectriccurrent
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