Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation

Empirical mode decomposition (EMD) is a signal analysis method which has received much attention lately due to its application in a number of fields. The main disadvantage of EMD is that it lacks a theoretical analysis and, therefore, our understanding of EMD comes from an intuitive and experimental...

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Main Authors: Steve McLaughlin, Yannis Kopsinis
Format: Article
Language:English
Published: SpringerOpen 2008-04-01
Series:EURASIP Journal on Advances in Signal Processing
Online Access:http://dx.doi.org/10.1155/2008/128293
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spelling doaj-79b6e0b8b0f44c7ea2ad59cd82d9632b2020-11-25T01:56:13ZengSpringerOpenEURASIP Journal on Advances in Signal Processing1687-61721687-61802008-04-01200810.1155/2008/128293Improved EMD Using Doubly-Iterative Sifting and High Order Spline InterpolationSteve McLaughlinYannis KopsinisEmpirical mode decomposition (EMD) is a signal analysis method which has received much attention lately due to its application in a number of fields. The main disadvantage of EMD is that it lacks a theoretical analysis and, therefore, our understanding of EMD comes from an intuitive and experimental validation of the method. Recent research on EMD revealed improved criteria for the interpolation points selection. More specifically, it was shown that the performance of EMD can be significantly enhanced if, as interpolation points, instead of the signal extrema, the extrema of the subsignal having the higher instantaneous frequency are used. Even if the extrema of the subsignal with the higher instantaneous frequency are not known in advance, this new interpolation points criterion can be effectively exploited in doubly-iterative sifting schemes leading to improved decomposition performance. In this paper, the possibilities and limitations of the developments above are explored and the new methods are compared with the conventional EMD.http://dx.doi.org/10.1155/2008/128293
collection DOAJ
language English
format Article
sources DOAJ
author Steve McLaughlin
Yannis Kopsinis
spellingShingle Steve McLaughlin
Yannis Kopsinis
Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
EURASIP Journal on Advances in Signal Processing
author_facet Steve McLaughlin
Yannis Kopsinis
author_sort Steve McLaughlin
title Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
title_short Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
title_full Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
title_fullStr Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
title_full_unstemmed Improved EMD Using Doubly-Iterative Sifting and High Order Spline Interpolation
title_sort improved emd using doubly-iterative sifting and high order spline interpolation
publisher SpringerOpen
series EURASIP Journal on Advances in Signal Processing
issn 1687-6172
1687-6180
publishDate 2008-04-01
description Empirical mode decomposition (EMD) is a signal analysis method which has received much attention lately due to its application in a number of fields. The main disadvantage of EMD is that it lacks a theoretical analysis and, therefore, our understanding of EMD comes from an intuitive and experimental validation of the method. Recent research on EMD revealed improved criteria for the interpolation points selection. More specifically, it was shown that the performance of EMD can be significantly enhanced if, as interpolation points, instead of the signal extrema, the extrema of the subsignal having the higher instantaneous frequency are used. Even if the extrema of the subsignal with the higher instantaneous frequency are not known in advance, this new interpolation points criterion can be effectively exploited in doubly-iterative sifting schemes leading to improved decomposition performance. In this paper, the possibilities and limitations of the developments above are explored and the new methods are compared with the conventional EMD.
url http://dx.doi.org/10.1155/2008/128293
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