Data on lateral photocurrent along a Cu(In,Ga)Se2 thin film as a function of air exposure time
Wavelength-dependent (i.e. penetration-depth-dependent) lateral photocurrent (iLP) measurement has been used to extract depth-resolved Lc profiles, where Lc is the minority carrier collection length by diffusion. The extracted Lc depth-profiles can be used to determine the minority carrier diffusion...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2019-12-01
|
| Series: | Data in Brief |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352340919310236 |