Low-Contrast Defects Recognition Using Low-Order Residual Network
Low-contrast defects recognition is a dramatically difficult issue in the field of image recognition. The traditional machine vision method is mainly suitable for defects with obvious feature differences. In recent years, machine learning techniques have been successfully applied to the image analys...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8740991/ |