Electron ptychographic microscopy for three-dimensional imaging

Electron ptychographic microscopy for three-dimensional imaging

Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination wi...

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Main Authors: Si Gao, Peng Wang, Fucai Zhang, Gerardo T. Martinez, Peter D. Nellist, Xiaoqing Pan, Angus I. Kirkland
Format: Article
Language:English
Published: Nature Publishing Group 2017-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-017-00150-1
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spelling doaj-781ca002c7e44d20b92f6d9431ca3c112021-01-31T12:38:25ZengNature Publishing GroupNature Communications2041-17232017-07-01811810.1038/s41467-017-00150-1Electron ptychographic microscopy for three-dimensional imagingSi Gao0Peng Wang1Fucai Zhang2Gerardo T. Martinez3Peter D. Nellist4Xiaoqing Pan5Angus I. Kirkland6National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Collaborative Innovation Center of Advanced Microstructures and Center for the Microstructures of Quantum Materials, Nanjing UniversityNational Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Collaborative Innovation Center of Advanced Microstructures and Center for the Microstructures of Quantum Materials, Nanjing UniversityDepartment of Electrical and Electronic Engineering, Southern University of Science and TechnologyDepartment of Materials, University of OxfordDepartment of Materials, University of OxfordNational Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Collaborative Innovation Center of Advanced Microstructures and Center for the Microstructures of Quantum Materials, Nanjing UniversityDepartment of Materials, University of OxfordThree-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons.https://doi.org/10.1038/s41467-017-00150-1
collection DOAJ
language English
format Article
sources DOAJ
author Si Gao
Peng Wang
Fucai Zhang
Gerardo T. Martinez
Peter D. Nellist
Xiaoqing Pan
Angus I. Kirkland
spellingShingle Si Gao
Peng Wang
Fucai Zhang
Gerardo T. Martinez
Peter D. Nellist
Xiaoqing Pan
Angus I. Kirkland
Electron ptychographic microscopy for three-dimensional imaging
Nature Communications
author_facet Si Gao
Peng Wang
Fucai Zhang
Gerardo T. Martinez
Peter D. Nellist
Xiaoqing Pan
Angus I. Kirkland
author_sort Si Gao
title Electron ptychographic microscopy for three-dimensional imaging
title_short Electron ptychographic microscopy for three-dimensional imaging
title_full Electron ptychographic microscopy for three-dimensional imaging
title_fullStr Electron ptychographic microscopy for three-dimensional imaging
title_full_unstemmed Electron ptychographic microscopy for three-dimensional imaging
title_sort electron ptychographic microscopy for three-dimensional imaging
publisher Nature Publishing Group
series Nature Communications
issn 2041-1723
publishDate 2017-07-01
description Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons.
url https://doi.org/10.1038/s41467-017-00150-1
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AT pengwang electronptychographicmicroscopyforthreedimensionalimaging
AT fucaizhang electronptychographicmicroscopyforthreedimensionalimaging
AT gerardotmartinez electronptychographicmicroscopyforthreedimensionalimaging
AT peterdnellist electronptychographicmicroscopyforthreedimensionalimaging
AT xiaoqingpan electronptychographicmicroscopyforthreedimensionalimaging
AT angusikirkland electronptychographicmicroscopyforthreedimensionalimaging
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