FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications

Accurate prediction of the large-scale channel fading is fundamental to planning and optimization in 5G millimeter-wave cellular networks. The current prediction methods, which are either too computationally expensive or inaccurate, are unsuitable for city-scale cell planning and optimization. This...

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Main Authors: Vishnu V. Ratnam, Hao Chen, Sameer Pawar, Bingwen Zhang, Charlie Jianzhong Zhang, Young-Jin Kim, Soonyoung Lee, Minsung Cho, Sung-Rok Yoon
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9311729/
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spelling doaj-7653d8ffffea479487cb37132947cadc2021-03-30T14:50:58ZengIEEEIEEE Access2169-35362021-01-0193278329010.1109/ACCESS.2020.30485839311729FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its ApplicationsVishnu V. Ratnam0https://orcid.org/0000-0002-6599-0549Hao Chen1https://orcid.org/0000-0003-0814-9144Sameer Pawar2Bingwen Zhang3Charlie Jianzhong Zhang4Young-Jin Kim5Soonyoung Lee6Minsung Cho7Sung-Rok Yoon8https://orcid.org/0000-0002-2294-8068Standards and Mobility Innovation Laboratory, Samsung Research America, Plano, TX, USAStandards and Mobility Innovation Laboratory, Samsung Research America, Plano, TX, USAStandards and Mobility Innovation Laboratory, Samsung Research America, Plano, TX, USAStandards and Mobility Innovation Laboratory, Samsung Research America, Plano, TX, USAStandards and Mobility Innovation Laboratory, Samsung Research America, Plano, TX, USANetwork Division, Network Automation Group, Samsung Electronics Company Ltd., Suwon, South KoreaNetwork Division, Network Automation Group, Samsung Electronics Company Ltd., Suwon, South KoreaNetwork Division, Network Automation Group, Samsung Electronics Company Ltd., Suwon, South KoreaNetwork Division, Network Automation Group, Samsung Electronics Company Ltd., Suwon, South KoreaAccurate prediction of the large-scale channel fading is fundamental to planning and optimization in 5G millimeter-wave cellular networks. The current prediction methods, which are either too computationally expensive or inaccurate, are unsuitable for city-scale cell planning and optimization. This paper presents FadeNet, a convolutional neural-network enabled alternative for predicting large-scale fading with high computation speed and accuracy. By using carefully designed input features and neural-network architecture to capture topographical information, FadeNet accurately predicts the large-scale fading from a base station to each location in its coverage area. Evaluations on realistic data, derived from millimeter-wave cells across multiple cities, suggest that FadeNet can achieve a prediction accuracy of 5.6 decibels in root mean square error. In addition, by leveraging the parallel processing capabilities of a graphics processing unit, FadeNet can reduce the prediction time by 40X - 1000X in comparison to industry prevalent methods like ray-tracing. Generalizations of FadeNet, that can handle variable topographies and base station heights, and its use for optimal cell site selection are also explored.https://ieeexplore.ieee.org/document/9311729/Cell planningchannel modelingconvolutional networksdeep learninglarge scale fadingmm-Wave
collection DOAJ
language English
format Article
sources DOAJ
author Vishnu V. Ratnam
Hao Chen
Sameer Pawar
Bingwen Zhang
Charlie Jianzhong Zhang
Young-Jin Kim
Soonyoung Lee
Minsung Cho
Sung-Rok Yoon
spellingShingle Vishnu V. Ratnam
Hao Chen
Sameer Pawar
Bingwen Zhang
Charlie Jianzhong Zhang
Young-Jin Kim
Soonyoung Lee
Minsung Cho
Sung-Rok Yoon
FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
IEEE Access
Cell planning
channel modeling
convolutional networks
deep learning
large scale fading
mm-Wave
author_facet Vishnu V. Ratnam
Hao Chen
Sameer Pawar
Bingwen Zhang
Charlie Jianzhong Zhang
Young-Jin Kim
Soonyoung Lee
Minsung Cho
Sung-Rok Yoon
author_sort Vishnu V. Ratnam
title FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
title_short FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
title_full FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
title_fullStr FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
title_full_unstemmed FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
title_sort fadenet: deep learning-based mm-wave large-scale channel fading prediction and its applications
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2021-01-01
description Accurate prediction of the large-scale channel fading is fundamental to planning and optimization in 5G millimeter-wave cellular networks. The current prediction methods, which are either too computationally expensive or inaccurate, are unsuitable for city-scale cell planning and optimization. This paper presents FadeNet, a convolutional neural-network enabled alternative for predicting large-scale fading with high computation speed and accuracy. By using carefully designed input features and neural-network architecture to capture topographical information, FadeNet accurately predicts the large-scale fading from a base station to each location in its coverage area. Evaluations on realistic data, derived from millimeter-wave cells across multiple cities, suggest that FadeNet can achieve a prediction accuracy of 5.6 decibels in root mean square error. In addition, by leveraging the parallel processing capabilities of a graphics processing unit, FadeNet can reduce the prediction time by 40X - 1000X in comparison to industry prevalent methods like ray-tracing. Generalizations of FadeNet, that can handle variable topographies and base station heights, and its use for optimal cell site selection are also explored.
topic Cell planning
channel modeling
convolutional networks
deep learning
large scale fading
mm-Wave
url https://ieeexplore.ieee.org/document/9311729/
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