In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air

Nanoparticles generated during laser material processing are often seen as annoying side products, yet they might find useful application upon proper collection. We present a parametric study to identify the dominant factors in nanoparticle removal and collection with the goal of establishing an in...

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Bibliographic Details
Main Authors: Nithin Joy, Anne-Marie Kietzig
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Nanomaterials
Subjects:
PLD
Online Access:https://www.mdpi.com/2079-4991/11/9/2264
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spelling doaj-764a8ae34b1d440480a874c7fc82503e2021-09-26T00:48:25ZengMDPI AGNanomaterials2079-49912021-08-01112264226410.3390/nano11092264In Situ Collection of Nanoparticles during Femtosecond Laser Machining in AirNithin Joy0Anne-Marie Kietzig1Department of Chemical Engineering, McGill University, Montreal, QC H3A 0C5, CanadaDepartment of Chemical Engineering, McGill University, Montreal, QC H3A 0C5, CanadaNanoparticles generated during laser material processing are often seen as annoying side products, yet they might find useful application upon proper collection. We present a parametric study to identify the dominant factors in nanoparticle removal and collection with the goal of establishing an in situ removal method during femtosecond laser machining. Several target materials of different electrical resistivity, such as Cu, Ti, and Si were laser machined at a relatively high laser fluence. Machining was performed under three different charge conditions, i.e., machining without an externally applied charge (alike atmospheric pulsed laser deposition (PLD)) was compared to machining with a floating potential and with an applied field. Thereby, we investigated the influence of three different charge conditions on the behavior of laser-generated nanoparticles, in particular considering plume deflection, nanoparticle accumulation on a collector plate and their redeposition onto the target. We found that both strategies, machining under a floating potential or under an applied field, were effective for collecting laser-generated nanoparticles. The applied field condition led to the strongest confinement of the nanoparticle plume and tightest resulting nanoparticle collection pattern. Raster-scanning direction was found to influence the nanoparticle collection pattern and ablation depth. However, the laser-processed target surface remained unaffected by the chosen nanoparticle collection strategy. We conclude that machining under a floating potential or an applied field is a promising setup for removing and collecting nanoparticles during the machining process, and thus provides an outlook to circular waste-free laser process design.https://www.mdpi.com/2079-4991/11/9/2264nanoparticlesapplied fieldapplied chargePLDlaser processingplume
collection DOAJ
language English
format Article
sources DOAJ
author Nithin Joy
Anne-Marie Kietzig
spellingShingle Nithin Joy
Anne-Marie Kietzig
In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
Nanomaterials
nanoparticles
applied field
applied charge
PLD
laser processing
plume
author_facet Nithin Joy
Anne-Marie Kietzig
author_sort Nithin Joy
title In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
title_short In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
title_full In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
title_fullStr In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
title_full_unstemmed In Situ Collection of Nanoparticles during Femtosecond Laser Machining in Air
title_sort in situ collection of nanoparticles during femtosecond laser machining in air
publisher MDPI AG
series Nanomaterials
issn 2079-4991
publishDate 2021-08-01
description Nanoparticles generated during laser material processing are often seen as annoying side products, yet they might find useful application upon proper collection. We present a parametric study to identify the dominant factors in nanoparticle removal and collection with the goal of establishing an in situ removal method during femtosecond laser machining. Several target materials of different electrical resistivity, such as Cu, Ti, and Si were laser machined at a relatively high laser fluence. Machining was performed under three different charge conditions, i.e., machining without an externally applied charge (alike atmospheric pulsed laser deposition (PLD)) was compared to machining with a floating potential and with an applied field. Thereby, we investigated the influence of three different charge conditions on the behavior of laser-generated nanoparticles, in particular considering plume deflection, nanoparticle accumulation on a collector plate and their redeposition onto the target. We found that both strategies, machining under a floating potential or under an applied field, were effective for collecting laser-generated nanoparticles. The applied field condition led to the strongest confinement of the nanoparticle plume and tightest resulting nanoparticle collection pattern. Raster-scanning direction was found to influence the nanoparticle collection pattern and ablation depth. However, the laser-processed target surface remained unaffected by the chosen nanoparticle collection strategy. We conclude that machining under a floating potential or an applied field is a promising setup for removing and collecting nanoparticles during the machining process, and thus provides an outlook to circular waste-free laser process design.
topic nanoparticles
applied field
applied charge
PLD
laser processing
plume
url https://www.mdpi.com/2079-4991/11/9/2264
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