Pattern Detection Model Using a Deep Learning Algorithm for Power Data Analysis in Abnormal Conditions

Pattern Detection Model Using a Deep Learning Algorithm for Power Data Analysis in Abnormal Conditions

Building a pattern detection model using a deep learning algorithm for data collected from manufacturing sites is an effective way for to perform decision-making and assess business feasibility for enterprises, by providing the results and implications of the patterns analysis of big data occurring...

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Bibliographic Details
Main Authors: Jeong-Hee Lee, Jongseok Kang, We Shim, Hyun-Sang Chung, Tae-Eung Sung
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Electronics
Subjects:
manufacturing big-data
fault detection
abnormal pattern
labelling
neural network
hybrid model
Online Access:https://www.mdpi.com/2079-9292/9/7/1140

Internet

https://www.mdpi.com/2079-9292/9/7/1140

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