Apparatus and Method of Defect Detection for Resin Films

• Main Authors: Ruey-Kai Sheu, Ya-Hsin Teng, Chien-Hao Tseng, Lun-Chi Chen
• Format: Article
• Language: English
• Published: MDPI AG 2020-02-01
• Series: Applied Sciences
• Subjects: microscale; defect inspection; convolution neural network; plastic resin films
• Online Access: https://www.mdpi.com/2076-3417/10/4/1206

A defect inspection of resin films involves processes of detecting defects, size measuring, type classification and reflective action planning. It is not only a process requiring heavy investment in workforce, but also a tension between quality assurance with a 50-micrometer tolerance and visibility of the naked eye. To solve the difficulties of the workforce and time consumption processes of defect inspection, an apparatus is designed to collect high-quality images in one shot by leveraging a large field-of-view microscope at 2K resolution. Based on the image dataset, a two-step method is used to first locate possible defects and predict their types by a defect-shape-based deep learning model using the LeNet-5-adjusted network. The experimental results show that the proposed method can precisely locate the position and accurately inspect the fine-grained defects of resin films.