Negative Differential Resistance Behavior in Delta-Doped AlInP Structure Grown by MOCVD
An AlInP delta-doped schottky diode exhibiting negative differential resistance (NDR) behavior is demonstrated for the first time. The NDR characteristics with a peak to valley ratio of 5.5 and peak current density of 1KA/cm2 were achieved at room temperature. In addition, the maximum available pow...
Main Author: | K. F. Yarn |
---|---|
Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2002-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1080/08827510213497 |
Similar Items
-
MOCVD-Grown InGa/GaAs Emitter Delta Doping Heterojunction Bipolar Transistors
by: K. F. Yarn
Published: (2002-01-01) -
The Study of Defects in Te-doped AlInP
by: Sung, Wei-Jer, et al.
Published: (1998) -
The Study of Defects in Te- and Mg-doped AlInP
by: Chien-Yi Hsu, et al.
Published: (1999) -
Impact ionisation in AlInP photodiodes
by: Ong, Siok Lan
Published: (2012) -
The study of material properties of AlInP and GaP epitaxial layers grown on differential misorientated GaAs substrates
by: Chia-hung Lin, et al.
Published: (2005)