Optical Characterization of Different Thin Film Module Technologies

Optical Characterization of Different Thin Film Module Technologies

For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent poss...

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Bibliographic Details
Main Authors:	R. Ebner, B. Kubicek, G. Újvári, S. Novalin, M. Rennhofer, M. Halwachs
Format:	Article
Language:	English
Published:	Hindawi Limited 2015-01-01
Series:	International Journal of Photoenergy
Online Access:	http://dx.doi.org/10.1155/2015/159458

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