Optical Characterization of Different Thin Film Module Technologies

Optical Characterization of Different Thin Film Module Technologies

For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent poss...

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Main Authors: R. Ebner, B. Kubicek, G. Újvári, S. Novalin, M. Rennhofer, M. Halwachs
Format: Article
Language:English
Published: Hindawi Limited 2015-01-01
Series:International Journal of Photoenergy
Online Access:http://dx.doi.org/10.1155/2015/159458
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spelling doaj-739bb68e2401473abe81981e331b616d2020-11-24T23:23:06ZengHindawi LimitedInternational Journal of Photoenergy1110-662X1687-529X2015-01-01201510.1155/2015/159458159458Optical Characterization of Different Thin Film Module TechnologiesR. Ebner0B. Kubicek1G. Újvári2S. Novalin3M. Rennhofer4M. Halwachs5Photovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaPhotovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaPhotovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaPhotovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaPhotovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaPhotovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, AustriaFor a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.http://dx.doi.org/10.1155/2015/159458
collection DOAJ
language English
format Article
sources DOAJ
author R. Ebner
B. Kubicek
G. Újvári
S. Novalin
M. Rennhofer
M. Halwachs
spellingShingle R. Ebner
B. Kubicek
G. Újvári
S. Novalin
M. Rennhofer
M. Halwachs
Optical Characterization of Different Thin Film Module Technologies
International Journal of Photoenergy
author_facet R. Ebner
B. Kubicek
G. Újvári
S. Novalin
M. Rennhofer
M. Halwachs
author_sort R. Ebner
title Optical Characterization of Different Thin Film Module Technologies
title_short Optical Characterization of Different Thin Film Module Technologies
title_full Optical Characterization of Different Thin Film Module Technologies
title_fullStr Optical Characterization of Different Thin Film Module Technologies
title_full_unstemmed Optical Characterization of Different Thin Film Module Technologies
title_sort optical characterization of different thin film module technologies
publisher Hindawi Limited
series International Journal of Photoenergy
issn 1110-662X
1687-529X
publishDate 2015-01-01
description For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.
url http://dx.doi.org/10.1155/2015/159458
work_keys_str_mv AT rebner opticalcharacterizationofdifferentthinfilmmoduletechnologies
AT bkubicek opticalcharacterizationofdifferentthinfilmmoduletechnologies
AT gujvari opticalcharacterizationofdifferentthinfilmmoduletechnologies
AT snovalin opticalcharacterizationofdifferentthinfilmmoduletechnologies
AT mrennhofer opticalcharacterizationofdifferentthinfilmmoduletechnologies
AT mhalwachs opticalcharacterizationofdifferentthinfilmmoduletechnologies
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