Convolution of Barker and Golay Codes for Low Voltage Ultrasonic Testing

• Main Authors: Zeng Fan, John Rudlin, Giorgos Asfis, Hongying Meng
• Format: Article
• Language: English
• Published: MDPI AG 2019-10-01
• Series: Technologies
• Subjects: ultrasonic testing; coded excitation; snr; golay code; barker code
• Online Access: https://www.mdpi.com/2227-7080/7/4/72

Ultrasonic Testing (UT) is one of the most important technologies in Non-Detective Testing (NDT) methods. Recently, Barker code and Golay code pairs as coded excitation signals have been applied in ultrasound imaging system with improved quality. However, the signal-to-noise ratio (SNR) of existing UT system based on Barker code or Golay code can be influenced under high high attenuation materials or noisy conditions. In this paper, we apply the convolution of Barker and Golay codes as coded excitation signals for low voltage UT devices that combines the advantages of Barker code and Golay code together. There is no need to change the hardware of UT system in this method. The proposed method has been analyzed theoretically and then in extensive simulations. The experimental results demonstrated that the main lobe level of the code produced by convolution of Barker code and Golay code pairs is much higher than the simple pulse and the main lobe of the combined code is higher than the traditional Barker code, sidelobe is the same as the baker code that constitutes this combined code. So the peak sidelobe level (PSL) of the combined code is lower than the traditional Barker code. Equipped with this, UT devices can be applied in low voltage situations.