Electrical Switching in Thin Films of Nandi Flame Seed Cuticles
Current-voltage (𝐼-𝑉) characteristics of Nandi flame seed cuticles (NFSCs) have been studied as a function of irradiation, annealing, and poling temperature. The cuticles showed memory and threshold switching. Threshold voltage 𝑉th was about 5 V which is almost five times higher than 𝑉th observed i...
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Series: | International Journal of Polymer Science |
Online Access: | http://dx.doi.org/10.1155/2009/830270 |
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doaj-7338255b4d3c40b6b45f0ec2dfea3cfa2020-11-24T20:49:06ZengHindawi LimitedInternational Journal of Polymer Science1687-94221687-94302009-01-01200910.1155/2009/830270830270Electrical Switching in Thin Films of Nandi Flame Seed CuticlesWycliffe K. Kipnusu0Gabriel Katana1Charles M. Migwi2I. V. S. Rathore3Joshua R. Sangoro4Physics Department, Kenyatta University, P.O. Box 43844-00100, Nairobi, KenyaPhysics Department, Kenyatta University, P.O. Box 43844-00100, Nairobi, KenyaPhysics Department, Kenyatta University, P.O. Box 43844-00100, Nairobi, KenyaPhysics Department, Kenyatta University, P.O. Box 43844-00100, Nairobi, KenyaInstitute of Experimental Physics 1, University of Leipzig, 04103 Leipzig, GermanyCurrent-voltage (𝐼-𝑉) characteristics of Nandi flame seed cuticles (NFSCs) have been studied as a function of irradiation, annealing, and poling temperature. The cuticles showed memory and threshold switching. Threshold voltage 𝑉th was about 5 V which is almost five times higher than 𝑉th observed in synthetic polymers. The threshold voltage 𝑉th increased to 6–8 V after irradiation and annealing depending on the duration of annealing or irradiation. After switching, conductivity increased by an order of 102. In reverse bias, increase of current was observed and the memory hysteresis loop was at higher conductivity than at the time of switching. Switching effect was minimized at a poling temperature of 370 K. Formation of semiquinones and quinoid radicals from phenolic compounds may have contributed to electrical switching and hysteresis effect.http://dx.doi.org/10.1155/2009/830270 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Wycliffe K. Kipnusu Gabriel Katana Charles M. Migwi I. V. S. Rathore Joshua R. Sangoro |
spellingShingle |
Wycliffe K. Kipnusu Gabriel Katana Charles M. Migwi I. V. S. Rathore Joshua R. Sangoro Electrical Switching in Thin Films of Nandi Flame Seed Cuticles International Journal of Polymer Science |
author_facet |
Wycliffe K. Kipnusu Gabriel Katana Charles M. Migwi I. V. S. Rathore Joshua R. Sangoro |
author_sort |
Wycliffe K. Kipnusu |
title |
Electrical Switching in Thin Films of Nandi Flame Seed Cuticles |
title_short |
Electrical Switching in Thin Films of Nandi Flame Seed Cuticles |
title_full |
Electrical Switching in Thin Films of Nandi Flame Seed Cuticles |
title_fullStr |
Electrical Switching in Thin Films of Nandi Flame Seed Cuticles |
title_full_unstemmed |
Electrical Switching in Thin Films of Nandi Flame Seed Cuticles |
title_sort |
electrical switching in thin films of nandi flame seed cuticles |
publisher |
Hindawi Limited |
series |
International Journal of Polymer Science |
issn |
1687-9422 1687-9430 |
publishDate |
2009-01-01 |
description |
Current-voltage (𝐼-𝑉) characteristics of Nandi flame seed cuticles (NFSCs) have been studied as a function of irradiation, annealing, and poling temperature. The cuticles showed memory and threshold switching. Threshold voltage 𝑉th was about 5 V which is almost five times higher than 𝑉th observed in synthetic polymers. The threshold voltage 𝑉th increased to 6–8 V after irradiation and annealing depending on the duration of annealing or irradiation. After switching, conductivity increased by an order of 102. In reverse bias, increase of current was observed and the memory hysteresis loop was at higher conductivity than at the time of switching. Switching effect was minimized at a poling temperature of 370 K. Formation of semiquinones and quinoid radicals from phenolic compounds may have contributed to electrical switching and hysteresis effect. |
url |
http://dx.doi.org/10.1155/2009/830270 |
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