Exact run length distribution of the double sampling x-bar chart with estimated process parameters

Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart’s performance. Thus it is important to investigate the entire run length distributi...

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Bibliographic Details
Main Authors: Teoh, W. L., Fun, M. S., Teh, S. Y., Khoo, Michael B. C., Yeong, W. C.
Format: Article
Language:English
Published: Stellenbosch University 2016-05-01
Series:South African Journal of Industrial Engineering
Subjects:
Online Access:http://sajie.journals.ac.za/pub/article/view/978