High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits
For widespread technological application of nonlinear photonic integrated circuits, ultralow optical losses and high fabrication throughput are required. Here, the authors present a CMOS fabrication technique that realizes integrate photonic microresonators on waver-level with mean quality factors e...
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Online Access: | https://doi.org/10.1038/s41467-021-21973-z |
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doaj-6fe1bcd7c04b4aeebc420019f947e3452021-04-18T11:14:19ZengNature Publishing GroupNature Communications2041-17232021-04-011211910.1038/s41467-021-21973-zHigh-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuitsJunqiu Liu0Guanhao Huang1Rui Ning Wang2Jijun He3Arslan S. Raja4Tianyi Liu5Nils J. Engelsen6Tobias J. Kippenberg7Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL)For widespread technological application of nonlinear photonic integrated circuits, ultralow optical losses and high fabrication throughput are required. Here, the authors present a CMOS fabrication technique that realizes integrate photonic microresonators on waver-level with mean quality factors exceeding 30 million and 1 dB/m optical losses.https://doi.org/10.1038/s41467-021-21973-z |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Junqiu Liu Guanhao Huang Rui Ning Wang Jijun He Arslan S. Raja Tianyi Liu Nils J. Engelsen Tobias J. Kippenberg |
spellingShingle |
Junqiu Liu Guanhao Huang Rui Ning Wang Jijun He Arslan S. Raja Tianyi Liu Nils J. Engelsen Tobias J. Kippenberg High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits Nature Communications |
author_facet |
Junqiu Liu Guanhao Huang Rui Ning Wang Jijun He Arslan S. Raja Tianyi Liu Nils J. Engelsen Tobias J. Kippenberg |
author_sort |
Junqiu Liu |
title |
High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
title_short |
High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
title_full |
High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
title_fullStr |
High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
title_full_unstemmed |
High-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
title_sort |
high-yield, wafer-scale fabrication of ultralow-loss, dispersion-engineered silicon nitride photonic circuits |
publisher |
Nature Publishing Group |
series |
Nature Communications |
issn |
2041-1723 |
publishDate |
2021-04-01 |
description |
For widespread technological application of nonlinear photonic integrated circuits, ultralow optical losses and high fabrication throughput are required. Here, the authors present a CMOS fabrication technique that realizes integrate photonic microresonators on waver-level with mean quality factors exceeding 30 million and 1 dB/m optical losses. |
url |
https://doi.org/10.1038/s41467-021-21973-z |
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