Failure modes analysis of electrofluidic display under thermal ageing
Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was syste...
Main Authors: | Baoqin Dong, Biao Tang, Jan Groenewold, Hui Li, Rui Zhou, Alexander Victor Henzen, Guofu Zhou |
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Format: | Article |
Language: | English |
Published: |
The Royal Society
2018-01-01
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Series: | Royal Society Open Science |
Subjects: | |
Online Access: | https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.181121 |
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