A Novel IGBT Health Evaluation Method Based on Multi-Label Classification
The IGBT health evaluation of power semiconductor devices is usually based on the threshold evaluation method, which is usually a single characteristic parameter evaluation system. This kind of evaluation method cannot reflect the internal correlation of the change of multiple characteristic paramet...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8684243/ |