Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor

An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which als...

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Main Authors:	Robert E. Peale, Evan Smith, Christian W. Smith, Farnood Khalilzadeh-Rezaie, Masa Ishigami, Nima Nader, Shiva Vangala, Justin W. Cleary
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2016-09-01
Series:	APL Photonics
Online Access:	http://dx.doi.org/10.1063/1.4962428

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spelling	doaj-6f1cb3bbee764a7db79aabb654ecca282020-11-25T00:40:28ZengAIP Publishing LLCAPL Photonics2378-09672016-09-0116066103066103-810.1063/1.4962428005606APPElectronic detection of surface plasmon polaritons by metal-oxide-silicon capacitorRobert E. Peale0Evan Smith1Christian W. Smith2Farnood Khalilzadeh-Rezaie3Masa Ishigami4Nima Nader5Shiva Vangala6Justin W. Cleary7Department of Physics, University of Central Florida, Orlando, Florida 32816, USAAir Force Research Laboratory, Sensors Directorate, 2241 Avionics Circle, Wright-Patterson Air Force Base, Ohio 45433, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USAAir Force Research Laboratory, Sensors Directorate, 2241 Avionics Circle, Wright-Patterson Air Force Base, Ohio 45433, USAAir Force Research Laboratory, Sensors Directorate, 2241 Avionics Circle, Wright-Patterson Air Force Base, Ohio 45433, USAAir Force Research Laboratory, Sensors Directorate, 2241 Avionics Circle, Wright-Patterson Air Force Base, Ohio 45433, USAAn electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.http://dx.doi.org/10.1063/1.4962428
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Robert E. Peale Evan Smith Christian W. Smith Farnood Khalilzadeh-Rezaie Masa Ishigami Nima Nader Shiva Vangala Justin W. Cleary
spellingShingle	Robert E. Peale Evan Smith Christian W. Smith Farnood Khalilzadeh-Rezaie Masa Ishigami Nima Nader Shiva Vangala Justin W. Cleary Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor APL Photonics
author_facet	Robert E. Peale Evan Smith Christian W. Smith Farnood Khalilzadeh-Rezaie Masa Ishigami Nima Nader Shiva Vangala Justin W. Cleary
author_sort	Robert E. Peale
title	Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
title_short	Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
title_full	Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
title_fullStr	Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
title_full_unstemmed	Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
title_sort	electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
publisher	AIP Publishing LLC
series	APL Photonics
issn	2378-0967
publishDate	2016-09-01
description	An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.
url	http://dx.doi.org/10.1063/1.4962428
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Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor

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