Investigation of ZnS thin layers by thermal evaporation method (PVD)
Thin layers of ZnS in two different temperature conditions of 25 or 2000C and also with different thicknesses from 100nm to 600nm were prepared by physical vapor deposition. Absorption and also transmission spectra of the films were obtained to determine absorption coefficient, extinction constant a...
Main Authors: | MR Khanlary, N Ahmadi |
---|---|
Format: | Article |
Language: | English |
Published: |
Isfahan University of Technology
2011-03-01
|
Series: | Iranian Journal of Physics Research |
Subjects: | |
Online Access: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-492&slc_lang=en&sid=1 |
Similar Items
-
A comparative study of ZnO i-layer deposited with ALD and PVD for CIGS solar cells
by: Johansson Byberg, Joel
Published: (2019) -
Long-Term Retardation of Water Evaporation by Ultra-Thin Layers of Polydimethylsiloxanes in the Indoor Conditions
by: Volodymyr M. Zhuk, et al.
Published: (2021-09-01) -
Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film
by: Ingrida ANCUTIENĖ, et al.
Published: (2011-09-01) -
Annealing effects on the structural, electrical and optical properties of ZnO thin films prepared by thermal evaporation technique
by: A. Zaier, et al.
Published: (2015-10-01) -
Synthesis of indium oxi-sulfide films by atomic layer deposition: The essential role of plasma enhancement
by: Cathy Bugot, et al.
Published: (2013-11-01)