Conformation dependent electronic transport in a DNA double-helix

• Main Authors: Sourav Kundu, S. N. Karmakar
• Format: Article
• Language: English
• Published: AIP Publishing LLC 2015-10-01
• Series: AIP Advances
• Online Access: http://dx.doi.org/10.1063/1.4934507

We present a tight-binding study of conformation dependent electronic transport properties of DNA double-helix including its helical symmetry. We have studied the changes in the localization properties of DNA as we alter the number of stacked bases within every pitch of the double-helix keeping fixed the total number of nitrogen bases within the DNA molecule. We take three DNA sequences, two of them are periodic and one is random and observe that in all the cases localization length increases as we increase the radius of DNA double-helix i.e., number of nucleobases within a pitch. We have also investigated the effect of backbone energetic on the I-V response of the system and found that in presence of helical symmetry, depending on the interplay of conformal variation and disorder, DNA can be found in either metallic, semiconducting and insulating phases, as observed experimentally.